|
@ -13,8 +13,6 @@ env: |
|
|
- TEST_PLATFORM="DUE" |
|
|
- TEST_PLATFORM="DUE" |
|
|
- TEST_PLATFORM="esp32" |
|
|
- TEST_PLATFORM="esp32" |
|
|
- TEST_PLATFORM="linux_native" |
|
|
- TEST_PLATFORM="linux_native" |
|
|
- TEST_PLATFORM="LPC1768" |
|
|
|
|
|
- TEST_PLATFORM="LPC1769" |
|
|
|
|
|
- TEST_PLATFORM="megaatmega2560" |
|
|
- TEST_PLATFORM="megaatmega2560" |
|
|
- TEST_PLATFORM="STM32F103RE" |
|
|
- TEST_PLATFORM="STM32F103RE" |
|
|
- TEST_PLATFORM="teensy31" |
|
|
- TEST_PLATFORM="teensy31" |
|
@ -36,6 +34,10 @@ env: |
|
|
- TEST_PLATFORM="STM32F103VE_longer" |
|
|
- TEST_PLATFORM="STM32F103VE_longer" |
|
|
- TEST_PLATFORM="STM32F407VE_black" |
|
|
- TEST_PLATFORM="STM32F407VE_black" |
|
|
|
|
|
|
|
|
|
|
|
# Put lengthy tests last |
|
|
|
|
|
- TEST_PLATFORM="LPC1768" |
|
|
|
|
|
- TEST_PLATFORM="LPC1769" |
|
|
|
|
|
|
|
|
# Non-working environment tests |
|
|
# Non-working environment tests |
|
|
#- TEST_PLATFORM="at90usb1286_cdc" |
|
|
#- TEST_PLATFORM="at90usb1286_cdc" |
|
|
#- TEST_PLATFORM="at90usb1286_dfu" |
|
|
#- TEST_PLATFORM="at90usb1286_dfu" |
|
|